Design for Testability Reports (DFT)

   A Desing for Testability analysis identifies a list of key nodes (test points) that will require access to maximize and/or optimize their In-circuit (ICT) test coverage.

Standard DFT Reports

   Our standard design for testability reports includes a basic overview of test accessibility and a schematic overview. CAD analysis: test probe reports, test access reports, list of recommendations. Schematics analysis: list of recommendations (design changes) to improve coverage and provide a very effective test.

Advanced DFT Reports

   Our advanced design for testability repots includes a basic overview of limited access techniques.Boundary Scan analysis: verify that the Scan Chain is connected properly, Compliance Pins (Pins that need to be tied HIGH or LOW) are configured properly, the test points needed for Silicon Nails or Cover Extend techniques.